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Kim D, Mun J, Kim H, et al. Development of particle characteristics diagnosis system for nanoparticle analysis in vacuum. Rev Sci Instrum. 2016;87(2):023304doi: 10.1063/1.4942247.
Kim, D., Mun, J., Kim, H., Yun, J. Y., Kim, Y. J., Kim, T., Kim, T., & Kang, S. W. (2016). Development of particle characteristics diagnosis system for nanoparticle analysis in vacuum. The Review of scientific instruments, 87(2), 023304. https://doi.org/10.1063/1.4942247
Kim, Dongbin, et al. "Development of particle characteristics diagnosis system for nanoparticle analysis in vacuum." The Review of scientific instruments vol. 87,2 (2016): 023304. doi: https://doi.org/10.1063/1.4942247
Kim D, Mun J, Kim H, Yun JY, Kim YJ, Kim T, Kim T, Kang SW. Development of particle characteristics diagnosis system for nanoparticle analysis in vacuum. Rev Sci Instrum. 2016 Feb;87(2):023304. doi: 10.1063/1.4942247. PMID: 26931842.
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