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Hamann-Borrero JE, Macke S, Gray B, et al. Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry. Sci Rep. 2017;7(1):13792doi: 10.1038/s41598-017-12642-7.
Hamann-Borrero, J. E., Macke, S., Gray, B., Kareev, M., Schierle, E., Partzsch, S., Zwiebler, M., Treske, U., Koitzsch, A., Büchner, B., Freeland, J. W., Chakhalian, J., & Geck, J. (2017). Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry. Scientific reports, 7(1), 13792. https://doi.org/10.1038/s41598-017-12642-7
Hamann-Borrero, J E, et al. "Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry." Scientific reports vol. 7,1 (2017): 13792. doi: https://doi.org/10.1038/s41598-017-12642-7
Hamann-Borrero JE, Macke S, Gray B, Kareev M, Schierle E, Partzsch S, Zwiebler M, Treske U, Koitzsch A, Büchner B, Freeland JW, Chakhalian J, Geck J. Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry. Sci Rep. 2017 Oct 23;7(1):13792. doi: 10.1038/s41598-017-12642-7. PMID: 29061996; PMCID: PMC5653850.
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