Advanced Search
Display options
Filter resources
Text Availability
Article type
Publication date
Species
Language
Sex
Age
Showing 1 to 12 of 51 entries
Sorted by: Best Match Show Resources per page
Observation and coherent control of interface-induced electronic resonances in a field-effect transistor.

Nature materials

Tenorio-Pearl JO, Herbschleb ED, Fleming S, Creatore C, Oda S, Milne WI, Chin AW.
PMID: 27643731
Nat Mater. 2017 Feb;16(2):208-213. doi: 10.1038/nmat4754. Epub 2016 Sep 19.

Electronic defect states at material interfaces provide highly deleterious sources of noise in solid-state nanostructures, and even a single trapped charge can qualitatively alter the properties of short one-dimensional nanowire field-effect transistors (FET) and quantum bit (qubit) devices. Understanding...

Cite
Tenorio-Pearl JO, Herbschleb ED, Fleming S, et al. Observation and coherent control of interface-induced electronic resonances in a field-effect transistor. Nat Mater. 2016;16(2):208-213doi: 10.1038/nmat4754.
Tenorio-Pearl, J. O., Herbschleb, E. D., Fleming, S., Creatore, C., Oda, S., Milne, W. I., & Chin, A. W. (2017). Observation and coherent control of interface-induced electronic resonances in a field-effect transistor. Nature materials, 16(2), 208-213. https://doi.org/10.1038/nmat4754
Tenorio-Pearl, J O, et al. "Observation and coherent control of interface-induced electronic resonances in a field-effect transistor." Nature materials vol. 16,2 (2017): 208-213. doi: https://doi.org/10.1038/nmat4754
Tenorio-Pearl JO, Herbschleb ED, Fleming S, Creatore C, Oda S, Milne WI, Chin AW. Observation and coherent control of interface-induced electronic resonances in a field-effect transistor. Nat Mater. 2017 Feb;16(2):208-213. doi: 10.1038/nmat4754. Epub 2016 Sep 19. PMID: 27643731.
Copy Download .nbib Format: NLM
Metal-Organic Covalent Network Chemical Vapor Deposition for Gas Separation.

Advanced materials (Deerfield Beach, Fla.)

Boscher ND, Wang M, Perrotta A, Heinze K, Creatore M, Gleason KK.
PMID: 27296896
Adv Mater. 2016 Sep;28(34):7479-85. doi: 10.1002/adma.201601010. Epub 2016 Jun 14.

The chemical vapor deposition (CVD) polymerization of metalloporphyrin building units is demonstrated to provide an easily up-scalable one-step method toward the deposition of a new class of dense and defect-free metal-organic covalent network (MOCN) layers. The resulting hyper-thin and...

Cite
Boscher ND, Wang M, Perrotta A, et al. Metal-Organic Covalent Network Chemical Vapor Deposition for Gas Separation. Adv Mater. 2016;28(34):7479-85doi: 10.1002/adma.201601010.
Boscher, N. D., Wang, M., Perrotta, A., Heinze, K., Creatore, M., & Gleason, K. K. (2016). Metal-Organic Covalent Network Chemical Vapor Deposition for Gas Separation. Advanced materials (Deerfield Beach, Fla.), 28(34), 7479-85. https://doi.org/10.1002/adma.201601010
Boscher, Nicolas D, et al. "Metal-Organic Covalent Network Chemical Vapor Deposition for Gas Separation." Advanced materials (Deerfield Beach, Fla.) vol. 28,34 (2016): 7479-85. doi: https://doi.org/10.1002/adma.201601010
Boscher ND, Wang M, Perrotta A, Heinze K, Creatore M, Gleason KK. Metal-Organic Covalent Network Chemical Vapor Deposition for Gas Separation. Adv Mater. 2016 Sep;28(34):7479-85. doi: 10.1002/adma.201601010. Epub 2016 Jun 14. PMID: 27296896.
Copy Download .nbib Format: NLM
Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in LixFePO₄.

Nano letters

Yu YS, Kim C, Shapiro DA, Farmand M, Qian D, Tyliszczak T, Kilcoyne AL, Celestre R, Marchesini S, Joseph J, Denes P, Warwick T, Strobridge FC, Grey CP, Padmore H, Meng YS, Kostecki R, Cabana J.
PMID: 26061698
Nano Lett. 2015 Jul 08;15(7):4282-8. doi: 10.1021/acs.nanolett.5b01314. Epub 2015 Jun 18.

The performance of battery electrode materials is strongly affected by inefficiencies in utilization kinetics and cycle life as well as size effects. Observations of phase transformations in these materials with high chemical and spatial resolution can elucidate the relationship...

Cite
Yu YS, Kim C, Shapiro DA, et al. Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in LixFePO₄. Nano Lett. 2015;15(7):4282-8doi: 10.1021/acs.nanolett.5b01314.
Yu, Y. S., Kim, C., Shapiro, D. A., Farmand, M., Qian, D., Tyliszczak, T., Kilcoyne, A. L., Celestre, R., Marchesini, S., Joseph, J., Denes, P., Warwick, T., Strobridge, F. C., Grey, C. P., Padmore, H., Meng, Y. S., Kostecki, R., & Cabana, J. (2015). Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in LixFePO₄. Nano letters, 15(7), 4282-8. https://doi.org/10.1021/acs.nanolett.5b01314
Yu, Young-Sang, et al. "Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in LixFePO₄." Nano letters vol. 15,7 (2015): 4282-8. doi: https://doi.org/10.1021/acs.nanolett.5b01314
Yu YS, Kim C, Shapiro DA, Farmand M, Qian D, Tyliszczak T, Kilcoyne AL, Celestre R, Marchesini S, Joseph J, Denes P, Warwick T, Strobridge FC, Grey CP, Padmore H, Meng YS, Kostecki R, Cabana J. Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in LixFePO₄. Nano Lett. 2015 Jul 08;15(7):4282-8. doi: 10.1021/acs.nanolett.5b01314. Epub 2015 Jun 18. PMID: 26061698.
Copy Download .nbib Format: NLM
In response to Giannini's questions.

Minerva anestesiologica

Rubulotta F, Rubulotta G, Santonocito C, Ferla L, Celestre C, Occhipinti G, Ramsay G.
PMID: 20592677
Minerva Anestesiol. 2010 Aug;76(8):675-6. Epub 2010 Jul 01.

No abstract available.

Cite
Rubulotta F, Rubulotta G, Santonocito C, et al. In response to Giannini's questions. Minerva Anestesiol. 2010;76(8):675-6
Rubulotta, F., Rubulotta, G., Santonocito, C., Ferla, L., Celestre, C., Occhipinti, G., & Ramsay, G. (2010). In response to Giannini's questions. Minerva anestesiologica, 76(8), 675-6.
Rubulotta, F, et al. "In response to Giannini's questions." Minerva anestesiologica vol. 76,8 (2010): 675-6.
Rubulotta F, Rubulotta G, Santonocito C, Ferla L, Celestre C, Occhipinti G, Ramsay G. In response to Giannini's questions. Minerva Anestesiol. 2010 Aug;76(8):675-6. Epub 2010 Jul 01. PMID: 20592677.
Copy Download .nbib Format: NLM
A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source.

The Review of scientific instruments

Kunz M, Tamura N, Chen K, MacDowell AA, Celestre RS, Church MM, Fakra S, Domning EE, Glossinger JM, Kirschman JL, Morrison GY, Plate DW, Smith BV, Warwick T, Yashchuk VV, Padmore HA, Ustundag E.
PMID: 19334953
Rev Sci Instrum. 2009 Mar;80(3):035108. doi: 10.1063/1.3096295.

A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T...

Cite
Kunz M, Tamura N, Chen K, et al. A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source. Rev Sci Instrum. 2009;80(3):035108doi: 10.1063/1.3096295.
Kunz, M., Tamura, N., Chen, K., MacDowell, A. A., Celestre, R. S., Church, M. M., Fakra, S., Domning, E. E., Glossinger, J. M., Kirschman, J. L., Morrison, G. Y., Plate, D. W., Smith, B. V., Warwick, T., Yashchuk, V. V., Padmore, H. A., & Ustundag, E. (2009). A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source. The Review of scientific instruments, 80(3), 035108. https://doi.org/10.1063/1.3096295
Kunz, Martin, et al. "A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source." The Review of scientific instruments vol. 80,3 (2009): 035108. doi: https://doi.org/10.1063/1.3096295
Kunz M, Tamura N, Chen K, MacDowell AA, Celestre RS, Church MM, Fakra S, Domning EE, Glossinger JM, Kirschman JL, Morrison GY, Plate DW, Smith BV, Warwick T, Yashchuk VV, Padmore HA, Ustundag E. A dedicated superbend x-ray microdiffraction beamline for materials, geo-, and environmental sciences at the advanced light source. Rev Sci Instrum. 2009 Mar;80(3):035108. doi: 10.1063/1.3096295. PMID: 19334953.
Copy Download .nbib Format: NLM
Five-dimensional gravitational super Chern-Simons terms.

Physical review. D, Particles and fields

Ceresole A, Lerda A, van Nieuwenhuizen P.
PMID: 9957343
Phys Rev D Part Fields. 1986 Sep 15;34(6):1744-1748. doi: 10.1103/physrevd.34.1744.

No abstract available.

Cite
Ceresole A, Lerda A, van Nieuwenhuizen P. Five-dimensional gravitational super Chern-Simons terms. Phys Rev D Part Fields. 1986;34(6):1744-1748doi: 10.1103/physrevd.34.1744.
Ceresole, A., Lerda, A., & van Nieuwenhuizen P. (1986). Five-dimensional gravitational super Chern-Simons terms. Physical review. D, Particles and fields, 34(6), 1744-1748. https://doi.org/10.1103/physrevd.34.1744
Ceresole, et al. "Five-dimensional gravitational super Chern-Simons terms." Physical review. D, Particles and fields vol. 34,6 (1986): 1744-1748. doi: https://doi.org/10.1103/physrevd.34.1744
Ceresole A, Lerda A, van Nieuwenhuizen P. Five-dimensional gravitational super Chern-Simons terms. Phys Rev D Part Fields. 1986 Sep 15;34(6):1744-1748. doi: 10.1103/physrevd.34.1744. PMID: 9957343.
Copy Download .nbib Format: NLM
Curved-space trace, chiral, and Einstein anomalies from path integrals, using flat-space plane waves.

Physical review. D, Particles and fields

Ceresole A, Pizzochero P, van Nieuwenhuizen P.
PMID: 9959817
Phys Rev D Part Fields. 1989 Mar 15;39(6):1567-1578. doi: 10.1103/physrevd.39.1567.

No abstract available.

Cite
Ceresole A, Pizzochero P, van Nieuwenhuizen P. Curved-space trace, chiral, and Einstein anomalies from path integrals, using flat-space plane waves. Phys Rev D Part Fields. 1989;39(6):1567-1578doi: 10.1103/physrevd.39.1567.
Ceresole, A., Pizzochero, P., & van Nieuwenhuizen P. (1989). Curved-space trace, chiral, and Einstein anomalies from path integrals, using flat-space plane waves. Physical review. D, Particles and fields, 39(6), 1567-1578. https://doi.org/10.1103/physrevd.39.1567
Ceresole, et al. "Curved-space trace, chiral, and Einstein anomalies from path integrals, using flat-space plane waves." Physical review. D, Particles and fields vol. 39,6 (1989): 1567-1578. doi: https://doi.org/10.1103/physrevd.39.1567
Ceresole A, Pizzochero P, van Nieuwenhuizen P. Curved-space trace, chiral, and Einstein anomalies from path integrals, using flat-space plane waves. Phys Rev D Part Fields. 1989 Mar 15;39(6):1567-1578. doi: 10.1103/physrevd.39.1567. PMID: 9959817.
Copy Download .nbib Format: NLM
Corrigendum: Observation and coherent control of interface-induced electronic resonances in a field-effect transistor.

Nature materials

Tenorio-Pearl JO, Herbschleb ED, Fleming S, Creatore C, Oda S, Milne WI, Chin AW.
PMID: 28748965
Nat Mater. 2017 Jul 26;16(8):874. doi: 10.1038/nmat4944.

No abstract available.

Cite
Tenorio-Pearl JO, Herbschleb ED, Fleming S, et al. Corrigendum: Observation and coherent control of interface-induced electronic resonances in a field-effect transistor. Nat Mater. 2017;16(8):874doi: 10.1038/nmat4944.
Tenorio-Pearl, J. O., Herbschleb, E. D., Fleming, S., Creatore, C., Oda, S., Milne, W. I., & Chin, A. W. (2017). Corrigendum: Observation and coherent control of interface-induced electronic resonances in a field-effect transistor. Nature materials, 16(8), 874. https://doi.org/10.1038/nmat4944
Tenorio-Pearl, J O, et al. "Corrigendum: Observation and coherent control of interface-induced electronic resonances in a field-effect transistor." Nature materials vol. 16,8 (2017): 874. doi: https://doi.org/10.1038/nmat4944
Tenorio-Pearl JO, Herbschleb ED, Fleming S, Creatore C, Oda S, Milne WI, Chin AW. Corrigendum: Observation and coherent control of interface-induced electronic resonances in a field-effect transistor. Nat Mater. 2017 Jul 26;16(8):874. doi: 10.1038/nmat4944. PMID: 28748965.
Copy Download .nbib Format: NLM
Analysis of Nanoporosity in Moisture Permeation Barrier Layers by Electrochemical Impedance Spectroscopy.

ACS applied materials & interfaces

Perrotta A, García SJ, Michels JJ, Andringa AM, Creatore M.
PMID: 26147606
ACS Appl Mater Interfaces. 2015 Jul 29;7(29):15968-77. doi: 10.1021/acsami.5b04060. Epub 2015 Jul 15.

Water permeation in inorganic moisture permeation barriers occurs through macroscale defects/pinholes and nanopores, the latter with size approaching the water kinetic diameter (0.27 nm). Both permeation paths can be identified by the calcium test, i.e., a time-consuming and expensive...

Cite
Perrotta A, García SJ, Michels JJ, et al. Analysis of Nanoporosity in Moisture Permeation Barrier Layers by Electrochemical Impedance Spectroscopy. ACS Appl Mater Interfaces. 2015;7(29):15968-77doi: 10.1021/acsami.5b04060.
Perrotta, A., García, S. J., Michels, J. J., Andringa, A. M., & Creatore, M. (2015). Analysis of Nanoporosity in Moisture Permeation Barrier Layers by Electrochemical Impedance Spectroscopy. ACS applied materials & interfaces, 7(29), 15968-77. https://doi.org/10.1021/acsami.5b04060
Perrotta, Alberto, et al. "Analysis of Nanoporosity in Moisture Permeation Barrier Layers by Electrochemical Impedance Spectroscopy." ACS applied materials & interfaces vol. 7,29 (2015): 15968-77. doi: https://doi.org/10.1021/acsami.5b04060
Perrotta A, García SJ, Michels JJ, Andringa AM, Creatore M. Analysis of Nanoporosity in Moisture Permeation Barrier Layers by Electrochemical Impedance Spectroscopy. ACS Appl Mater Interfaces. 2015 Jul 29;7(29):15968-77. doi: 10.1021/acsami.5b04060. Epub 2015 Jul 15. PMID: 26147606.
Copy Download .nbib Format: NLM
Chemical Analysis of the Interface between Hybrid Organic-Inorganic Perovskite and Atomic Layer Deposited Al.

ACS applied materials & interfaces

Koushik D, Hazendonk L, Zardetto V, Vandalon V, Verheijen MA, Kessels WMM, Creatore M.
PMID: 30624886
ACS Appl Mater Interfaces. 2019 Feb 06;11(5):5526-5535. doi: 10.1021/acsami.8b18307. Epub 2019 Jan 24.

Ultrathin metal oxides prepared by atomic layer deposition (ALD) have gained utmost attention as moisture and thermal stress barrier layers in perovskite solar cells (PSCs). We have recently shown that 10 cycles of ALD Al

Cite
Koushik D, Hazendonk L, Zardetto V, et al. Chemical Analysis of the Interface between Hybrid Organic-Inorganic Perovskite and Atomic Layer Deposited Al. ACS Appl Mater Interfaces. 2019;11(5):5526-5535doi: 10.1021/acsami.8b18307.
Koushik, D., Hazendonk, L., Zardetto, V., Vandalon, V., Verheijen, M. A., Kessels, W. M. M., & Creatore, M. (2019). Chemical Analysis of the Interface between Hybrid Organic-Inorganic Perovskite and Atomic Layer Deposited Al. ACS applied materials & interfaces, 11(5), 5526-5535. https://doi.org/10.1021/acsami.8b18307
Koushik, Dibyashree, et al. "Chemical Analysis of the Interface between Hybrid Organic-Inorganic Perovskite and Atomic Layer Deposited Al." ACS applied materials & interfaces vol. 11,5 (2019): 5526-5535. doi: https://doi.org/10.1021/acsami.8b18307
Koushik D, Hazendonk L, Zardetto V, Vandalon V, Verheijen MA, Kessels WMM, Creatore M. Chemical Analysis of the Interface between Hybrid Organic-Inorganic Perovskite and Atomic Layer Deposited Al. ACS Appl Mater Interfaces. 2019 Feb 06;11(5):5526-5535. doi: 10.1021/acsami.8b18307. Epub 2019 Jan 24. PMID: 30624886; PMCID: PMC6369720.
Copy Download .nbib Format: NLM
X-ray optics and beam characterization using random modulation: theory.

Journal of synchrotron radiation

Berujon S, Cojocaru R, Piault P, Celestre R, Roth T, Barrett R, Ziegler E.
PMID: 32153267
J Synchrotron Radiat. 2020 Mar 01;27:284-292. doi: 10.1107/S1600577520000491. Epub 2020 Feb 20.

X-ray near-field speckle-based phase-sensing approaches provide efficient means of characterizing optical elements. Presented here is a theoretical review of several of these speckle methods within the framework of optical characterization, and a generalization of the concept is provided. As...

Cite
Berujon S, Cojocaru R, Piault P, et al. X-ray optics and beam characterization using random modulation: theory. J Synchrotron Radiat. 2020;27:284-292doi: 10.1107/S1600577520000491.
Berujon, S., Cojocaru, R., Piault, P., Celestre, R., Roth, T., Barrett, R., & Ziegler, E. (2020). X-ray optics and beam characterization using random modulation: theory. Journal of synchrotron radiation, 27284-292. https://doi.org/10.1107/S1600577520000491
Berujon, Sebastien, et al. "X-ray optics and beam characterization using random modulation: theory." Journal of synchrotron radiation vol. 27 (2020): 284-292. doi: https://doi.org/10.1107/S1600577520000491
Berujon S, Cojocaru R, Piault P, Celestre R, Roth T, Barrett R, Ziegler E. X-ray optics and beam characterization using random modulation: theory. J Synchrotron Radiat. 2020 Mar 01;27:284-292. doi: 10.1107/S1600577520000491. Epub 2020 Feb 20. PMID: 32153267.
Copy Download .nbib Format: NLM
A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline.

Journal of synchrotron radiation

Sanchez Del Rio M, Celestre R, Glass M, Pirro G, Herrera JR, Barrett R, da Silva JC, Cloetens P, Shi X, Rebuffi L.
PMID: 31721731
J Synchrotron Radiat. 2019 Nov 01;26:1887-1901. doi: 10.1107/S160057751901213X. Epub 2019 Oct 18.

Different approaches to simulate a modern X-ray beamline are considered. Several methodologies with increasing complexity are applied to discuss the relevant parameters that quantify the beamline performance. Parameters such as flux, dimensions and intensity distribution of the focused beam,...

Cite
Sanchez Del Rio M, Celestre R, Glass M, et al. A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline. J Synchrotron Radiat. 2019;26:1887-1901doi: 10.1107/S160057751901213X.
Sanchez Del Rio, M., Celestre, R., Glass, M., Pirro, G., Herrera, J. R., Barrett, R., da Silva, J. C., Cloetens, P., Shi, X., & Rebuffi, L. (2019). A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline. Journal of synchrotron radiation, 261887-1901. https://doi.org/10.1107/S160057751901213X
Sanchez Del Rio, Manuel, et al. "A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline." Journal of synchrotron radiation vol. 26 (2019): 1887-1901. doi: https://doi.org/10.1107/S160057751901213X
Sanchez Del Rio M, Celestre R, Glass M, Pirro G, Herrera JR, Barrett R, da Silva JC, Cloetens P, Shi X, Rebuffi L. A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline. J Synchrotron Radiat. 2019 Nov 01;26:1887-1901. doi: 10.1107/S160057751901213X. Epub 2019 Oct 18. PMID: 31721731.
Copy Download .nbib Format: NLM
Showing 1 to 12 of 51 entries