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Science. 2000 Feb 11;287(5455):1014-6. doi: 10.1126/science.287.5455.1014.

Observation of antiferromagnetic domains in epitaxial thin films.

Science (New York, N.Y.)

Scholl, Stohr, Luning, Seo, Fompeyrine, Siegwart, Locquet, Nolting, Anders, Fullerton, Scheinfein, Padmore

Affiliations

  1. Advanced Light Source, 1 Cyclotron Road, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA. IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120, USA. IBM Research Division, Zurich Research Laboratory.

PMID: 10669407 DOI: 10.1126/science.287.5455.1014

Abstract

Antiferromagnetic domains in an epitaxial thin film, LaFeO(3) on SrTiO(3)(100), were observed using a high-spatial-resolution photoelectron emission microscope with contrast generated by the large x-ray magnetic linear dichroism effect at the multiplet-split L edge of Fe. The antiferromagnetic domains are linked to 90 degrees twinned crystallographic regions in the film. The Neel temperature of the thin film is reduced by 70 kelvin relative to the bulk material, and this reduction is attributed to epitaxial strain. These studies open the door for a microscopic understanding of the magnetic coupling across antiferromagnetic-ferromagnetic interfaces.

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