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De Neve K, Strijckmans K, Dams R. Feasibility study on the characterization of thin layers by charged-particle activation analysis. Anal Chem. 2000;72(13):2814-20doi: 10.1021/ac000187c.
De Neve K, Strijckmans, K., & Dams, R. (2000). Feasibility study on the characterization of thin layers by charged-particle activation analysis. Analytical chemistry, 72(13), 2814-20. https://doi.org/10.1021/ac000187c
De Neve K, et al. "Feasibility study on the characterization of thin layers by charged-particle activation analysis." Analytical chemistry vol. 72,13 (2000): 2814-20. doi: https://doi.org/10.1021/ac000187c
De Neve K, Strijckmans K, Dams R. Feasibility study on the characterization of thin layers by charged-particle activation analysis. Anal Chem. 2000 Jul 01;72(13):2814-20. doi: 10.1021/ac000187c. PMID: 10905312.
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