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Aassime A, Johansson G, Wendin G, et al. Radio-frequency single-electron transistor as readout device for qubits: charge sensitivity and backaction. Phys Rev Lett. 2001;86(15):3376-9doi: 10.1103/PhysRevLett.86.3376.
Aassime, A., Johansson, G., Wendin, G., Schoelkopf, R. J., & Delsing, P. (2001). Radio-frequency single-electron transistor as readout device for qubits: charge sensitivity and backaction. Physical review letters, 86(15), 3376-9. https://doi.org/10.1103/PhysRevLett.86.3376
Aassime, A, et al. "Radio-frequency single-electron transistor as readout device for qubits: charge sensitivity and backaction." Physical review letters vol. 86,15 (2001): 3376-9. doi: https://doi.org/10.1103/PhysRevLett.86.3376
Aassime A, Johansson G, Wendin G, Schoelkopf RJ, Delsing P. Radio-frequency single-electron transistor as readout device for qubits: charge sensitivity and backaction. Phys Rev Lett. 2001 Apr 09;86(15):3376-9. doi: 10.1103/PhysRevLett.86.3376. PMID: 11327974.
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Phys Rev Lett. 2001 Apr 09;86(15):3376-9. doi: 10.1103/PhysRevLett.86.3376.

Radio-frequency single-electron transistor as readout device for qubits: charge sensitivity and backaction.

Physical review letters

A Aassime, G Johansson, G Wendin, R J Schoelkopf, P Delsing

Affiliations

  1. Microtechnology Center at Chalmers MC2, Department of Microelectronics and Nanoscience, Chalmers University of Technology and Göteborg University, S-412 96, Göteborg, Sweden.

PMID: 11327974 DOI: 10.1103/PhysRevLett.86.3376

Abstract

We study the radio-frequency single-electron transistor (rf-SET) as a readout device for charge qubits. We measure the charge sensitivity of an rf-SET to be 6.3microe/sqrt[Hz] and evaluate the backaction of the rf-SET on a single Cooper-pair box. This allows us to compare the needed measurement time with the mixing time of the qubit imposed by the measurement. We find that the mixing time can be substantially longer than the measurement time, which would allow readout of the state of the qubit in a single shot measurement.

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