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Arcon I, Mozetic M, Kodre A, et al. EXAFS study of NiAl in thin films. J Synchrotron Radiat. 2001;8:493-5doi: 10.1107/s0909049500016642.
Arcon, I., Mozetic, M., Kodre, A., Jagielski, J., & Traverse, A. (2001). EXAFS study of NiAl in thin films. Journal of synchrotron radiation, 8493-5. https://doi.org/10.1107/s0909049500016642
Arcon, I, et al. "EXAFS study of NiAl in thin films." Journal of synchrotron radiation vol. 8 (2001): 493-5. doi: https://doi.org/10.1107/s0909049500016642
Arcon I, Mozetic M, Kodre A, Jagielski J, Traverse A. EXAFS study of NiAl in thin films. J Synchrotron Radiat. 2001 Mar 01;8:493-5. doi: 10.1107/s0909049500016642. PMID: 11512827.
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J Synchrotron Radiat. 2001 Mar 01;8:493-5. doi: 10.1107/s0909049500016642.

EXAFS study of NiAl in thin films.

Journal of synchrotron radiation

I Arcon, M Mozetic, A Kodre, J Jagielski, A Traverse

Affiliations

  1. Nova Gorica Polytechnic, Slovenia. [email protected]

PMID: 11512827 DOI: 10.1107/s0909049500016642

Abstract

Technologically important coatings of transition-metal aluminides call be produced by thermal or ion beam mixing of multilayer structures sputter deposited on substrates. The quantitative detection of constituents by depth profiling is sufficient to establish the efficiency of mixing methods. However, to decide whether a mixture of nanoparticles or a stoichiometric alloy is formed, EXAFS analysis of the local atomic neighborhood in the film is required. Ni K edge EXAFS spectra are measured on a series of samples of Ni/Al multilayer on Si(111) surface, after ion mixing at different substrate temperatures. The spectra show that with increasing temperature the nickel aluminide phase gradually substitutes the Ni fcc metal phase.

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