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Le Bolloc'h D, Livet F, Bley F, et al. X-ray diffraction from rectangular slits. J Synchrotron Radiat. 2002;9:258-65doi: 10.1107/s0909049502005708.
Le Bolloc'h, D., Livet, F., Bley, F., Schulli, T., Veron, M., & Metzger, T. H. (2002). X-ray diffraction from rectangular slits. Journal of synchrotron radiation, 9258-65. https://doi.org/10.1107/s0909049502005708
Le Bolloc'h, D, et al. "X-ray diffraction from rectangular slits." Journal of synchrotron radiation vol. 9 (2002): 258-65. doi: https://doi.org/10.1107/s0909049502005708
Le Bolloc'h D, Livet F, Bley F, Schulli T, Veron M, Metzger TH. X-ray diffraction from rectangular slits. J Synchrotron Radiat. 2002 Jul 01;9:258-65. doi: 10.1107/s0909049502005708. Epub 2002 Jun 30. PMID: 12091737.
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J Synchrotron Radiat. 2002 Jul 01;9:258-65. doi: 10.1107/s0909049502005708. Epub 2002 Jun 30.

X-ray diffraction from rectangular slits.

Journal of synchrotron radiation

D Le Bolloc'h, F Livet, F Bley, T Schulli, M Veron, T H Metzger

Affiliations

  1. LPS, UMR-CNRS8502, U. Paris-Sud, Bat. 510, 91405 Orsay CEDEX, France.

PMID: 12091737 DOI: 10.1107/s0909049502005708

Abstract

It is shown that for micrometre-sized beams the X-ray diffraction from slits is a source of strong parasitic background, even for slits of high quality. In order to illustrate this effect, the coherent diffraction from rectangular slits has been studied in detail. A large number of interference fringes with strong visibility have been observed using a single set of slits made of polished cylinders. For very small apertures, asymmetrical slits generate asymmetrical patterns. This pattern is calculated from the theory of electromagnetic field propagation and compared with experiment in the far-field regime. The use of guard slits to remove Fraunhofer diffraction from the beam-defining slits is treated theoretically. Numerical simulations yield the optimum aperture of the guard slits with respect to the distance to the primary slits. Diffraction theory is shown to be essential to understand how to reduce the background-to-signal ratio in high-resolution experiments.

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