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Thomas TD, Miron C, Wiesner K, et al. Anomalous natural linewidth in the 2p photoelectron spectrum of SiF4. Phys Rev Lett. 2002;89(22):223001doi: 10.1103/PhysRevLett.89.223001.
Thomas, T. D., Miron, C., Wiesner, K., Morin, P., Carroll, T. X., & Saethre, L. J. (2002). Anomalous natural linewidth in the 2p photoelectron spectrum of SiF4. Physical review letters, 89(22), 223001. https://doi.org/10.1103/PhysRevLett.89.223001
Thomas, T D, et al. "Anomalous natural linewidth in the 2p photoelectron spectrum of SiF4." Physical review letters vol. 89,22 (2002): 223001. doi: https://doi.org/10.1103/PhysRevLett.89.223001
Thomas TD, Miron C, Wiesner K, Morin P, Carroll TX, Saethre LJ. Anomalous natural linewidth in the 2p photoelectron spectrum of SiF4. Phys Rev Lett. 2002 Nov 25;89(22):223001. doi: 10.1103/PhysRevLett.89.223001. Epub 2002 Nov 06. PMID: 12485066.
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Phys Rev Lett. 2002 Nov 25;89(22):223001. doi: 10.1103/PhysRevLett.89.223001. Epub 2002 Nov 06.

Anomalous natural linewidth in the 2p photoelectron spectrum of SiF4.

Physical review letters

T D Thomas, C Miron, K Wiesner, P Morin, T X Carroll, L J Saethre

Affiliations

  1. Department of Chemistry, Oregon State University, Corvallis 97331-4003, USA.

PMID: 12485066 DOI: 10.1103/PhysRevLett.89.223001

Abstract

The silicon 2p photoelectron spectra for SiH4, SiF4, and SiCl4 have been analyzed to give the natural linewidths of the Si 2p hole states, which reflect the Auger decay rates of the states. For SiH4 the measured width of 38 meV is in approximate agreement with the prediction of the one-center model (32 meV), but that for SiF4 of 79 meV is more than 5 times the value of 14 meV predicted by this model. Approximate theoretical calculations indicate that valence electrons from the fluorine atoms of SiF4 play an important role in the Auger decay via interatomic processes.

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