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Agger JR, Hanif N, Cundy CS, et al. Silicalite crystal growth investigated by atomic force microscopy. J Am Chem Soc. 2003;125(3):830-9doi: 10.1021/ja020899f.
Agger, J. R., Hanif, N., Cundy, C. S., Wade, A. P., Dennison, S., Rawlinson, P. A., & Anderson, M. W. (2003). Silicalite crystal growth investigated by atomic force microscopy. Journal of the American Chemical Society, 125(3), 830-9. https://doi.org/10.1021/ja020899f
Agger, Jonathan R, et al. "Silicalite crystal growth investigated by atomic force microscopy." Journal of the American Chemical Society vol. 125,3 (2003): 830-9. doi: https://doi.org/10.1021/ja020899f
Agger JR, Hanif N, Cundy CS, Wade AP, Dennison S, Rawlinson PA, Anderson MW. Silicalite crystal growth investigated by atomic force microscopy. J Am Chem Soc. 2003 Jan 22;125(3):830-9. doi: 10.1021/ja020899f. PMID: 12526684.
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