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Simanovskii D, Palanker D, Cohn K, et al. Transient optical elements: application to near-field microscopy. J Microsc. 2003;210:307-10doi: 10.1046/j.1365-2818.2003.01156.x.
Simanovskii, D., Palanker, D., Cohn, K., & Smith, T. (2003). Transient optical elements: application to near-field microscopy. Journal of microscopy, 210307-10. https://doi.org/10.1046/j.1365-2818.2003.01156.x
Simanovskii, D, et al. "Transient optical elements: application to near-field microscopy." Journal of microscopy vol. 210 (2003): 307-10. doi: https://doi.org/10.1046/j.1365-2818.2003.01156.x
Simanovskii D, Palanker D, Cohn K, Smith T. Transient optical elements: application to near-field microscopy. J Microsc. 2003 Jun;210:307-10. doi: 10.1046/j.1365-2818.2003.01156.x. PMID: 12787104.
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