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Mana G, Palmisano C. A Fourier optics approach to the dynamical theory of X-ray diffraction--continuously deformed crystals. Acta Crystallogr A. 2004;60:283-93doi: 10.1107/S0108767304009420.
Mana, G., & Palmisano, C. (2004). A Fourier optics approach to the dynamical theory of X-ray diffraction--continuously deformed crystals. Acta crystallographica. Section A, Foundations of crystallography, 60283-93. https://doi.org/10.1107/S0108767304009420
Mana, Giovanni, and Palmisano, Carlo. "A Fourier optics approach to the dynamical theory of X-ray diffraction--continuously deformed crystals." Acta crystallographica. Section A, Foundations of crystallography vol. 60 (2004): 283-93. doi: https://doi.org/10.1107/S0108767304009420
Mana G, Palmisano C. A Fourier optics approach to the dynamical theory of X-ray diffraction--continuously deformed crystals. Acta Crystallogr A. 2004 Jul;60:283-93. doi: 10.1107/S0108767304009420. Epub 2004 Jun 24. PMID: 15218205.
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Acta Crystallogr A. 2004 Jul;60:283-93. doi: 10.1107/S0108767304009420. Epub 2004 Jun 24.

A Fourier optics approach to the dynamical theory of X-ray diffraction--continuously deformed crystals.

Acta crystallographica. Section A, Foundations of crystallography

Giovanni Mana, Carlo Palmisano

Affiliations

  1. CNR-Istituto di Metrologia 'G. Colonnetti', str. delle cacce 73, 10135 Torino, Italy. [email protected]

PMID: 15218205 DOI: 10.1107/S0108767304009420

Abstract

X-ray diffraction in continuously deformed crystals is considered by application of Fourier optics and from the viewpoint of the analogy between X-ray dynamics and the motion of two-level systems in quantum mechanics. Different forms of Takagi's equations are traced back to a common framework and it is shown that they are different ways to represent the same propagation equation. A novel way to solve Takagi's equations in the presence of a constant strain gradient is presented and approximation methods derived from quantum mechanics are considered. Crystal deformation in X-ray interferometry and two-crystal spectrometry are discussed and it is demonstrated that Si lattice-parameter measurements depend on the diffracting plane spacing on the crystal surface.

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