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Phys Rev Lett. 2004 Jun 18;92(24):246102. doi: 10.1103/PhysRevLett.92.246102. Epub 2004 Jun 16.

Kinetic roughening of laser deposited polymer films: crossover from single particle character to continuous growth.

Physical review letters

Jörg Hachenberg, Christoph Streng, Erik Süske, Sebastian Vauth, S G Mayr, Hans-Ulrich Krebs, Konrad Samwer

Affiliations

  1. I. Physikalisches Institut, Universität Göttingen, Tammannstrasse 1, 37077 Goettingen, Germany.

PMID: 15245107 DOI: 10.1103/PhysRevLett.92.246102

Abstract

The crossover in kinetic roughening of thin films from a particle-character-dominated regime to continuous growth behavior has been observed in this work. This has been accomplished by atomic force microscopy investigations of pulsed laser deposited amorphous organic films with thicknesses ranging from several nanometers to more than 4 microm. The early-stage random-deposition-like processes end once a closed layer is formed, which grows without saturation on the characteristic length scales. In addition, the influence of oblique film deposition has been examined and interpreted.

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