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Hafizovic S, Barrettino D, Volden T, et al. Single-chip mechatronic microsystem for surface imaging and force response studies. Proc Natl Acad Sci U S A. 2004;101(49):17011-5doi: 10.1073/pnas.0405725101.
Hafizovic, S., Barrettino, D., Volden, T., Sedivy, J., Kirstein, K. U., Brand, O., & Hierlemann, A. (2004). Single-chip mechatronic microsystem for surface imaging and force response studies. Proceedings of the National Academy of Sciences of the United States of America, 101(49), 17011-5. https://doi.org/10.1073/pnas.0405725101
Hafizovic, Sadik, et al. "Single-chip mechatronic microsystem for surface imaging and force response studies." Proceedings of the National Academy of Sciences of the United States of America vol. 101,49 (2004): 17011-5. doi: https://doi.org/10.1073/pnas.0405725101
Hafizovic S, Barrettino D, Volden T, Sedivy J, Kirstein KU, Brand O, Hierlemann A. Single-chip mechatronic microsystem for surface imaging and force response studies. Proc Natl Acad Sci U S A. 2004 Dec 07;101(49):17011-5. doi: 10.1073/pnas.0405725101. Epub 2004 Nov 29. PMID: 15569945; PMCID: PMC535376.
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Proc Natl Acad Sci U S A. 2004 Dec 07;101(49):17011-5. doi: 10.1073/pnas.0405725101. Epub 2004 Nov 29.

Single-chip mechatronic microsystem for surface imaging and force response studies.

Proceedings of the National Academy of Sciences of the United States of America

Sadik Hafizovic, Diego Barrettino, Tormod Volden, Jan Sedivy, Kay-Uwe Kirstein, Oliver Brand, Andreas Hierlemann

Affiliations

  1. Physical Electronics Laboratory, Swiss Federal Institute of Technology, Hoenggerberg HPT-H4.2, Wolfgang-PauliStrasse 16, 8093 Zurich, Switzerland.

PMID: 15569945 PMCID: PMC535376 DOI: 10.1073/pnas.0405725101

Abstract

We report on a stand-alone single-chip (7 x 10 mm) atomic force microscopy unit including a fully integrated array of cantilevers, each of which has an individual actuation, detection, and control unit so that standard atomic force microscopy operations can be performed by means of the chip only without any external controller. The system offers drastically reduced overall size and costs as well as increased scanning speed and can be fabricated with standard complementary metal oxide semiconductor technology with some subsequent micromachining steps to form the cantilevers. Full integration of microelectronic and micromechanical components on the same chip allows for the controlling and monitoring of all system functions. The on-chip circuitry, which includes analog signal amplification and filtering stages with offset compensation, analog-to-digital converters, a powerful digital signal processor, and an on-chip digital interface for data transmission, notably improves the overall system performance. The microsystem characterization evidenced a vertical resolution of < 1 nm and a force resolution of < 1 nN as shown in the measurement results. The monolithic system represents a paradigm of a mechatronic microsystem that allows for precise and fully controlled mechanical manipulation in the nanoworld.

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