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Li H, Rieker GB, Liu X, et al. Extension of wavelength-modulation spectroscopy to large modulation depth for diode laser absorption measurements in high-pressure gases. Appl Opt. 2006;45(5):1052-61doi: 10.1364/ao.45.001052.
Li, H., Rieker, G. B., Liu, X., Jeffries, J. B., & Hanson, R. K. (2006). Extension of wavelength-modulation spectroscopy to large modulation depth for diode laser absorption measurements in high-pressure gases. Applied optics, 45(5), 1052-61. https://doi.org/10.1364/ao.45.001052
Li, Hejie, et al. "Extension of wavelength-modulation spectroscopy to large modulation depth for diode laser absorption measurements in high-pressure gases." Applied optics vol. 45,5 (2006): 1052-61. doi: https://doi.org/10.1364/ao.45.001052
Li H, Rieker GB, Liu X, Jeffries JB, Hanson RK. Extension of wavelength-modulation spectroscopy to large modulation depth for diode laser absorption measurements in high-pressure gases. Appl Opt. 2006 Feb 10;45(5):1052-61. doi: 10.1364/ao.45.001052. PMID: 16512549.
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