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Pelizzo MG, Frassetto F, Nicolosi P, et al. Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers. Appl Opt. 2006;45(9):1985-92doi: 10.1364/ao.45.001985.
Pelizzo, M. G., Frassetto, F., Nicolosi, P., Giglia, A., Mahne, N., & Nannarone, S. (2006). Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers. Applied optics, 45(9), 1985-92. https://doi.org/10.1364/ao.45.001985
Pelizzo, Maria-Guglielmina, et al. "Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers." Applied optics vol. 45,9 (2006): 1985-92. doi: https://doi.org/10.1364/ao.45.001985
Pelizzo MG, Frassetto F, Nicolosi P, Giglia A, Mahne N, Nannarone S. Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers. Appl Opt. 2006 Mar 20;45(9):1985-92. doi: 10.1364/ao.45.001985. PMID: 16579569.
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Appl Opt. 2006 Mar 20;45(9):1985-92. doi: 10.1364/ao.45.001985.

Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers.

Applied optics

Maria-Guglielmina Pelizzo, F Frassetto, P Nicolosi, A Giglia, N Mahne, S Nannarone

Affiliations

  1. Istituto Nazionale per la Fisica della Materia-Laboratory for Ultraviolet and X-Ray Optical Research and Dipartimento di Ingegneria dell' Informazione, via Gradenigo 6B, 35131 Padua, Italy. [email protected]

PMID: 16579569 DOI: 10.1364/ao.45.001985

Abstract

A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure.

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