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Liao R, Romanov V, He S. Analytical method for the identification of a thin-strip defect in a planar waveguide. J Opt Soc Am A Opt Image Sci Vis. 2006;23(10):2650-6doi: 10.1364/josaa.23.002650.
Liao, R., Romanov, V., & He, S. (2006). Analytical method for the identification of a thin-strip defect in a planar waveguide. Journal of the Optical Society of America. A, Optics, image science, and vision, 23(10), 2650-6. https://doi.org/10.1364/josaa.23.002650
Liao, Ran, et al. "Analytical method for the identification of a thin-strip defect in a planar waveguide." Journal of the Optical Society of America. A, Optics, image science, and vision vol. 23,10 (2006): 2650-6. doi: https://doi.org/10.1364/josaa.23.002650
Liao R, Romanov V, He S. Analytical method for the identification of a thin-strip defect in a planar waveguide. J Opt Soc Am A Opt Image Sci Vis. 2006 Oct;23(10):2650-6. doi: 10.1364/josaa.23.002650. PMID: 16985550.
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J Opt Soc Am A Opt Image Sci Vis. 2006 Oct;23(10):2650-6. doi: 10.1364/josaa.23.002650.

Analytical method for the identification of a thin-strip defect in a planar waveguide.

Journal of the Optical Society of America. A, Optics, image science, and vision

Ran Liao, Vladimir Romanov, Sailing He

Affiliations

  1. Centre for Optical and Electromagnetic Research, Hangzhou, China.

PMID: 16985550 DOI: 10.1364/josaa.23.002650

Abstract

Nondestructive reconstruction of the location and width of a thin-strip defect in a strongly confined planar waveguide is considered. Explicit reconstruction formulas are given for a quick reconstruction of a thin-strip defect whose width is small by measuring the scattered fields at the two end faces of the planar waveguide for two frequencies. Numerical results are given, and the analytical reconstruction method is shown to be reliable regardless of the location of the defect.

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