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Beaulieu LY, Godin M, Laroche O, et al. A complete analysis of the laser beam deflection systems used in cantilever-based systems. Ultramicroscopy. 2006;107(4):422-30doi: 10.1016/j.ultramic.2006.11.001.
Beaulieu, L. Y., Godin, M., Laroche, O., Tabard-Cossa, V., & Grütter, P. (2007). A complete analysis of the laser beam deflection systems used in cantilever-based systems. Ultramicroscopy, 107(4), 422-30. https://doi.org/10.1016/j.ultramic.2006.11.001
Beaulieu, L Y, et al. "A complete analysis of the laser beam deflection systems used in cantilever-based systems." Ultramicroscopy vol. 107,4 (2007): 422-30. doi: https://doi.org/10.1016/j.ultramic.2006.11.001
Beaulieu LY, Godin M, Laroche O, Tabard-Cossa V, Grütter P. A complete analysis of the laser beam deflection systems used in cantilever-based systems. Ultramicroscopy. 2007 Apr-May;107(4):422-30. doi: 10.1016/j.ultramic.2006.11.001. Epub 2006 Nov 27. PMID: 17174033.
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Ultramicroscopy. 2007 Apr-May;107(4):422-30. doi: 10.1016/j.ultramic.2006.11.001. Epub 2006 Nov 27.

A complete analysis of the laser beam deflection systems used in cantilever-based systems.

Ultramicroscopy

L Y Beaulieu, Michel Godin, Olivier Laroche, Vincent Tabard-Cossa, Peter Grütter

Affiliations

  1. Department of Physics and Physical Oceanography, Memorial University. St. John's, NL., Canada A1B 3X7.

PMID: 17174033 DOI: 10.1016/j.ultramic.2006.11.001

Abstract

A working model has been developed which can be used to significantly increase the accuracy of cantilever deflection measurements using optical beam techniques (used in cantilever-based sensors and atomic force microscopes), while simultaneously simplifying their use. By using elementary geometric optics and standard vector analysis it is possible, without any fitted or adjustable parameters, to completely and accurately describe the relationship between the cantilever deflection and the signal measured by a position sensitive photo-detector. By arranging the geometry of the cantilever/optical beam, it is possible to tailor the detection system to make it more sensitive at different stages of the cantilever deflection or to simply linearize the relationship between the cantilever deflection and the measured detector signal. Supporting material and software has been made available for download at http://www.physics.mun.ca/beauliu_lab/papers/cantilever_analysis.htm so that the reader may take full advantage of the model presented herein with minimal effort.

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