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de Oteyza DG, Barrena E, Ossó JO, et al. Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films. J Am Chem Soc. 2006;128(47):15052-3doi: 10.1021/ja064641r.
de Oteyza, D. G., Barrena, E., Ossó, J. O., Sellner, S., & Dosch, H. (2006). Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films. Journal of the American Chemical Society, 128(47), 15052-3. https://doi.org/10.1021/ja064641r
de Oteyza, Dimas G, et al. "Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films." Journal of the American Chemical Society vol. 128,47 (2006): 15052-3. doi: https://doi.org/10.1021/ja064641r
de Oteyza DG, Barrena E, Ossó JO, Sellner S, Dosch H. Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films. J Am Chem Soc. 2006 Nov 29;128(47):15052-3. doi: 10.1021/ja064641r. PMID: 17117832.
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J Am Chem Soc. 2006 Nov 29;128(47):15052-3. doi: 10.1021/ja064641r.

Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films.

Journal of the American Chemical Society

Dimas G de Oteyza, Esther Barrena, J Oriol Ossó, Stefan Sellner, Helmut Dosch

Affiliations

  1. Max-Planck-Institut für Metallforschung, Heisenbergstr.3, 70569 Stuttgart, Germany.

PMID: 17117832 DOI: 10.1021/ja064641r

Abstract

The detailed structure of F16CuPc films on SiO2 has been determined by means of in situ grazing incidence X-ray diffraction from the first monolayer to thicker films. In contrast to films of the homologous H16CuPc molecule, the F16CuPc films exhibit the same structure independently from the deposition temperature. The films show a thickness-dependent polymorphism manifested in the in-plane crystal structure, which implies large differences in the molecular tilt within the cofacial stacking of the molecules.

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