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Mosimann R, Marty P, Bach T, et al. High-speed photorefraction at telecommunication wavelength 1.55 microm in Sn2P2S6:Te. Opt Lett. 2007;32(22):3230-2doi: 10.1364/ol.32.003230.
Mosimann, R., Marty, P., Bach, T., Juvalta, F., Jazbinsek, M., Günter, P., & Grabar, A. A. (2007). High-speed photorefraction at telecommunication wavelength 1.55 microm in Sn2P2S6:Te. Optics letters, 32(22), 3230-2. https://doi.org/10.1364/ol.32.003230
Mosimann, Roger, et al. "High-speed photorefraction at telecommunication wavelength 1.55 microm in Sn2P2S6:Te." Optics letters vol. 32,22 (2007): 3230-2. doi: https://doi.org/10.1364/ol.32.003230
Mosimann R, Marty P, Bach T, Juvalta F, Jazbinsek M, Günter P, Grabar AA. High-speed photorefraction at telecommunication wavelength 1.55 microm in Sn2P2S6:Te. Opt Lett. 2007 Nov 15;32(22):3230-2. doi: 10.1364/ol.32.003230. PMID: 18026263.
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Opt Lett. 2007 Nov 15;32(22):3230-2. doi: 10.1364/ol.32.003230.

High-speed photorefraction at telecommunication wavelength 1.55 microm in Sn2P2S6:Te.

Optics letters

Roger Mosimann, Patrick Marty, Tobias Bach, Flurin Juvalta, Mojca Jazbinsek, Peter Günter, Alexander A Grabar

Affiliations

  1. Nonlinear Optics Laboratory, Swiss Federal Institute of Technology, ETH Zurich 8093 Zurich, Switzerland. [email protected]

PMID: 18026263 DOI: 10.1364/ol.32.003230

Abstract

We demonstrated for what is the first time to our knowledge photorefractive two-wave mixing in a bulk ferroelectric crystal using cw light at the telecommunication wavelength 1.55 microm. In the Te-doped ferroelectric semiconductor Sn2P2S6 with absorption constant <0.1 cm(-1) at 1.55 microm, grating recording times of 10 ms and a two-beam coupling gain of 2.8 cm(-1) have been measured at 350 mW power (intensity 440 W/cm(2)) without a necessity to apply an external electric field. With a moving grating technique, a maximal gain of 6.0 cm(-1) has been obtained.

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