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Van Hoye E, Gijbels R, Adams F. Mass-spectrometric multielement analysis of copper and copper-base alloys, with electrical detection. Talanta. 1977;24(10):625-31doi: 10.1016/0039-9140(77)80107-0.
Van Hoye, E., Gijbels, R., & Adams, F. (1977). Mass-spectrometric multielement analysis of copper and copper-base alloys, with electrical detection. Talanta, 24(10), 625-31. https://doi.org/10.1016/0039-9140(77)80107-0
Van Hoye, E, et al. "Mass-spectrometric multielement analysis of copper and copper-base alloys, with electrical detection." Talanta vol. 24,10 (1977): 625-31. doi: https://doi.org/10.1016/0039-9140(77)80107-0
Van Hoye E, Gijbels R, Adams F. Mass-spectrometric multielement analysis of copper and copper-base alloys, with electrical detection. Talanta. 1977 Oct;24(10):625-31. doi: 10.1016/0039-9140(77)80107-0. PMID: 18962160.
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Talanta. 1977 Oct;24(10):625-31. doi: 10.1016/0039-9140(77)80107-0.

Mass-spectrometric multielement analysis of copper and copper-base alloys, with electrical detection.

Talanta

E Van Hoye, R Gijbels, F Adams

Affiliations

  1. Department of Chemistry, University of Antwerp (U.I.A.), Universiteitsplein 1, B-2610 Wilrijk, Belgium.

PMID: 18962160 DOI: 10.1016/0039-9140(77)80107-0

Abstract

Relative sensitivity coefficients have been determined for 21 elements in copper and its alloys, with iron as an internal standard, by spark-source mass-spectrometry with electrical detection and magnetic peak-switching. Twenty calibration standards ranging from pure copper to 60%-copper alloys were used. The sensitivity coefficients measured appear to be independent of the elemental concentration and are obtained with a mean precision of 15%.

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