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Phys Rev Lett. 2008 Sep 26;101(13):136103. doi: 10.1103/PhysRevLett.101.136103. Epub 2008 Sep 24.

Colloidal monolayer trapped near a charged wall: a synchrotron x-ray diffraction study.

Physical review letters

D K Satapathy, O Bunk, K Jefimovs, K Nygård, H Guo, A Diaz, E Perret, F Pfeiffer, C David, G H Wegdam, J F van der Veen

Affiliations

  1. Research Department of Synchrotron Radiation and Nanotechnology, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. [email protected]

PMID: 18851466 DOI: 10.1103/PhysRevLett.101.136103

Abstract

Using x-ray diffraction from microfluidic channel arrays, we have determined concentration profiles of charge-stabilized silica colloids (radius 60+/-2 nm) confined between two like-charged dielectric walls at a few hundred nanometer distance. In solutions of very low ionic strength, strongly repulsive Coulomb interactions drive the colloids toward the central region between the walls. The addition of a small quantity of salt ions (0.2 mM) causes a dense colloidal monolayer to be trapped near the walls.

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