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Huang AS, Arie Y, Neil CC, et al. Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides. Appl Opt. 1985;24(24):4404doi: 10.1364/ao.24.004404.
Huang, A. S., Arie, Y., Neil, C. C., & Hammer, J. M. (1985). Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides. Applied optics, 24(24), 4404. https://doi.org/10.1364/ao.24.004404
Huang, A S, et al. "Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides." Applied optics vol. 24,24 (1985): 4404. doi: https://doi.org/10.1364/ao.24.004404
Huang AS, Arie Y, Neil CC, Hammer JM. Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides. Appl Opt. 1985 Dec 15;24(24):4404. doi: 10.1364/ao.24.004404. PMID: 18224219.
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Appl Opt. 1985 Dec 15;24(24):4404. doi: 10.1364/ao.24.004404.

Study of refractive index of GeO2:SiO2 mixtures using deposited-thin-film optical waveguides.

Applied optics

A S Huang, Y Arie, C C Neil, J M Hammer

PMID: 18224219 DOI: 10.1364/ao.24.004404

[No abstract available.]

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