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Quispe J, Damiano J, Mick SE, et al. An improved holey carbon film for cryo-electron microscopy. Microsc Microanal. 2007;13(5):365-71doi: 10.1017/S1431927607070791.
Quispe, J., Damiano, J., Mick, S. E., Nackashi, D. P., Fellmann, D., Ajero, T. G., Carragher, B., & Potter, C. S. (2007). An improved holey carbon film for cryo-electron microscopy. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 13(5), 365-71. https://doi.org/10.1017/S1431927607070791
Quispe, Joel, et al. "An improved holey carbon film for cryo-electron microscopy." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 13,5 (2007): 365-71. doi: https://doi.org/10.1017/S1431927607070791
Quispe J, Damiano J, Mick SE, Nackashi DP, Fellmann D, Ajero TG, Carragher B, Potter CS. An improved holey carbon film for cryo-electron microscopy. Microsc Microanal. 2007 Oct;13(5):365-71. doi: 10.1017/S1431927607070791. PMID: 17900388.
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