Cite
Alloyeau D, Ricolleau C, Oikawa T, et al. Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles. Ultramicroscopy. 2009;109(7):788-96doi: 10.1016/j.ultramic.2009.02.002.
Alloyeau, D., Ricolleau, C., Oikawa, T., Langlois, C., Le Bouar, Y., & Loiseau, A. (2009). Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles. Ultramicroscopy, 109(7), 788-96. https://doi.org/10.1016/j.ultramic.2009.02.002
Alloyeau, D, et al. "Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles." Ultramicroscopy vol. 109,7 (2009): 788-96. doi: https://doi.org/10.1016/j.ultramic.2009.02.002
Alloyeau D, Ricolleau C, Oikawa T, Langlois C, Le Bouar Y, Loiseau A. Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles. Ultramicroscopy. 2009 Jun;109(7):788-96. doi: 10.1016/j.ultramic.2009.02.002. Epub 2009 Feb 28. PMID: 19327891.
Copy
Download .nbib