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Opt Express. 2006 Jun 12;14(12):5121-8. doi: 10.1364/oe.14.005121.

3-dimensional characterization of thick grating formation in PVA/AA based photopolymer.

Optics express

Sergi Gallego, Manuel Ortuño, Cristian Neipp, Andrés Márquez, Augusto Beléndez, Elena Fernández, Inmaculada Pascual

PMID: 19516676 DOI: 10.1364/oe.14.005121

Abstract

Large thickness is required in holographic recording materials to be used as holographic memories. Photopolymers have proved to be a good alternative to construct holographic memories. Nevertheless, modeling the behavior of thick layers poses some problems due to high absorption of the dye, as discussed in previous papers. In this study, the gratings stored in photopolymers based on PVA/AA are analyzed considering the attenuation of light in depth. This is done by fitting the theoretical results, predicted by a model that considers this effect, to the experimental results obtained using diffraction gratings recorded in PVA/AA based photopolymer. In order to determine the diffraction efficiency at the first Bragg angle, an algorithm based on the rigorous coupled wave theory is used. Also, the characteristics of the gratings obtained using different recording intensities are analyzed, and the effective optical thickness is seen to increase as the intensity is increased.

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