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Cvitkovic A, Ocelic N, Hillenbrand R. Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy. Opt Express. 2007;15(14):8550-65doi: 10.1364/oe.15.008550.
Cvitkovic, A., Ocelic, N., & Hillenbrand, R. (2007). Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy. Optics express, 15(14), 8550-65. https://doi.org/10.1364/oe.15.008550
Cvitkovic, A, et al. "Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy." Optics express vol. 15,14 (2007): 8550-65. doi: https://doi.org/10.1364/oe.15.008550
Cvitkovic A, Ocelic N, Hillenbrand R. Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy. Opt Express. 2007 Jul 09;15(14):8550-65. doi: 10.1364/oe.15.008550. PMID: 19547189.
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Opt Express. 2007 Jul 09;15(14):8550-65. doi: 10.1364/oe.15.008550.

Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy.

Optics express

A Cvitkovic, N Ocelic, R Hillenbrand

PMID: 19547189 DOI: 10.1364/oe.15.008550

Abstract

Nanometer-scale mapping of complex optical constants by scattering-type near-field microscopy has been suffering from quantitative discrepancies between the theory and experiments. To resolve this problem, a novel analytical model is presented here. The comparison with experimental data demonstrates that the model quantitatively reproduces approach curves on a Au surface and yields an unprecedented agreement with amplitude and phase spectra recorded on a phonon-polariton resonant SiC sample. The simple closed-form solution derived here should enable the determination of the local complex dielectric function on an unknown sample, thereby identifying its nanoscale chemical composition, crystal structure and conductivity.

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