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Hansch P, Van Woerkom LD. High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy. Opt Lett. 1996;21(16):1286-8doi: 10.1364/ol.21.001286.
Hansch, P., & Van Woerkom, L. D. (1996). High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy. Optics letters, 21(16), 1286-8. https://doi.org/10.1364/ol.21.001286
Hansch, P, and Van Woerkom, L D. "High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy." Optics letters vol. 21,16 (1996): 1286-8. doi: https://doi.org/10.1364/ol.21.001286
Hansch P, Van Woerkom LD. High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy. Opt Lett. 1996 Aug 15;21(16):1286-8. doi: 10.1364/ol.21.001286. PMID: 19876327.
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Opt Lett. 1996 Aug 15;21(16):1286-8. doi: 10.1364/ol.21.001286.

High-precision intensity-selective observation of multiphoton ionization: a new method of photoelectron spectroscopy.

Optics letters

P Hansch, L D Van Woerkom

PMID: 19876327 DOI: 10.1364/ol.21.001286

Abstract

We have developed a novel method of time-of-f light (TOF) photoelectron spectroscopy that permits observation of multiphoton ionizations with extremely high precision, especially for low-probability events. By scanning the laser-produced ionization region across a pinhole we can select specific laser peak intensities. The volumes occupied by low intensities rise rapidly compared with traditional straight TOF spectroscopy, resulting in high signal gains. This technique presents a new way of observing fundamental laser-matter interactions.

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