Appl Opt. 1977 Jan 01;16(1):214-7. doi: 10.1364/AO.16.000214.
Applied optics
L J Golden
PMID: 20168454 DOI: 10.1364/AO.16.000214
A step-by-step procedure for the manufacture of Zernike disks and the design and fabrication of a laboratory Zernike test instrument are described. A laboratory wavefront error simulator is used to evaluate the loworder aberration measurement sensitivity of the Zernike test instrument. Measurement sensitivities were found to be better than lambda/100 for all the low-order aberration types.