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Appl Opt. 1977 Jan 01;16(1):214-7. doi: 10.1364/AO.16.000214.

Zernike test. 2: Experimental aspects.

Applied optics

L J Golden

PMID: 20168454 DOI: 10.1364/AO.16.000214

Abstract

A step-by-step procedure for the manufacture of Zernike disks and the design and fabrication of a laboratory Zernike test instrument are described. A laboratory wavefront error simulator is used to evaluate the loworder aberration measurement sensitivity of the Zernike test instrument. Measurement sensitivities were found to be better than lambda/100 for all the low-order aberration types.

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