Display options
Cite
Symons JG, Christie EA, Peck MK. Integrating sphere for solar transmittance measurement of planar and nonplanar samples. Appl Opt. 1982;21(15):2827-32doi: 10.1364/AO.21.002827.
Symons, J. G., Christie, E. A., & Peck, M. K. (1982). Integrating sphere for solar transmittance measurement of planar and nonplanar samples. Applied optics, 21(15), 2827-32. https://doi.org/10.1364/AO.21.002827
Symons, J G, et al. "Integrating sphere for solar transmittance measurement of planar and nonplanar samples." Applied optics vol. 21,15 (1982): 2827-32. doi: https://doi.org/10.1364/AO.21.002827
Symons JG, Christie EA, Peck MK. Integrating sphere for solar transmittance measurement of planar and nonplanar samples. Appl Opt. 1982 Aug 01;21(15):2827-32. doi: 10.1364/AO.21.002827. PMID: 20396125.
Copy Download .nbib Format: NLM
Share it on

Appl Opt. 1982 Aug 01;21(15):2827-32. doi: 10.1364/AO.21.002827.

Integrating sphere for solar transmittance measurement of planar and nonplanar samples.

Applied optics

J G Symons, E A Christie, M K Peck

PMID: 20396125 DOI: 10.1364/AO.21.002827

Abstract

A new apparatus that incorporates an integrating sphere is described, which enables the solar transmittance of test samples to be measured as a function of both angle of incidence and azimuth angle. This apparatus was developed to perform measurements on both planar and nonplanar samples of larger dimensions than can be accommodated in a spectrophotometer. Solar transmittance measurements from this apparatus are compared with those from a Gier & Dunkle spectrophotometer for a range of sample materials, and excellent agreement has been found. Errors in solar transmittance measurement may arise from changes in the integrating sphere entrance port reflectance due to placement and then the removal of the test sample from the port. A correction procedure is derived to take account of these errors and is applicable to all single-beam integrating spheres.

Publication Types