J Microsc. 2010 Jul 01;239(1):32-45. doi: 10.1111/j.1365-2818.2009.03353.x.
Journal of microscopy
A Winkelmann
PMID: 20579267 DOI: 10.1111/j.1365-2818.2009.03353.x
This paper presents a tutorial discussion of the principles underlying the depth-dependent Kikuchi pattern formation of backscattered electrons in the scanning electron microscope. To illustrate the connections between various electron diffraction methods, the formation of Kikuchi bands in electron backscatter diffraction in the scanning electron microscope and in transmission electron microscopy are compared with the help of simulations employing the dynamical theory of electron diffraction. The close relationship between backscattered electron diffraction and convergent beam electron diffraction is illuminated by showing how both effects can be calculated within the same theoretical framework. The influence of the depth-dependence of diffuse electron scattering on the formation of the experimentally observed electron backscatter diffraction contrast and intensity is visualized by calculations of depth-resolved Kikuchi patterns. Comparison of an experimental electron backscatter diffraction pattern with simulations assuming several different depth distributions shows that the depth-distribution of backscattered electrons needs to be taken into account in quantitative descriptions. This should make it possible to obtain more quantitative depth-dependent information from experimental electron backscatter diffraction patterns via correlation with dynamical diffraction simulations and Monte Carlo models of electron scattering.
