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Cao J, Yanagihara M, Yamamoto M, et al. Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements. Appl Opt. 1994;33(10):2013-7doi: 10.1364/AO.33.002013.
Cao, J., Yanagihara, M., Yamamoto, M., Goto, Y., & Namioka, T. (1994). Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements. Applied optics, 33(10), 2013-7. https://doi.org/10.1364/AO.33.002013
Cao, J, et al. "Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements." Applied optics vol. 33,10 (1994): 2013-7. doi: https://doi.org/10.1364/AO.33.002013
Cao J, Yanagihara M, Yamamoto M, Goto Y, Namioka T. Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements. Appl Opt. 1994 Apr 01;33(10):2013-7. doi: 10.1364/AO.33.002013. PMID: 20885537.
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