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Sayler AM, Rathje T, Müller W, et al. Precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses. Opt Lett. 2011;36(1):1-3doi: 10.1364/OL.36.000001.
Sayler, A. M., Rathje, T., Müller, W., Rühle, K., Kienberger, R., & Paulus, G. G. (2011). Precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses. Optics letters, 36(1), 1-3. https://doi.org/10.1364/OL.36.000001
Sayler, A M, et al. "Precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses." Optics letters vol. 36,1 (2011): 1-3. doi: https://doi.org/10.1364/OL.36.000001
Sayler AM, Rathje T, Müller W, Rühle K, Kienberger R, Paulus GG. Precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses. Opt Lett. 2011 Jan 01;36(1):1-3. doi: 10.1364/OL.36.000001. PMID: 21209667.
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Opt Lett. 2011 Jan 01;36(1):1-3. doi: 10.1364/OL.36.000001.

Precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses.

Optics letters

A M Sayler, Tim Rathje, Walter Müller, Klaus Rühle, R Kienberger, G G Paulus

Affiliations

  1. Institut für Optik und Quantenelektronik, Max-Wien-Platz 1, 07743 Jena, Germany. [email protected]

PMID: 21209667 DOI: 10.1364/OL.36.000001

Abstract

In this Letter we demonstrate a method for real-time determination of the carrier-envelope phase of each and every single ultrashort laser pulse at kilohertz repetition rates. The technique expands upon the recent work of Wittmann and incorporates a stereographic above-threshold laser-induced ionization measurement and electronics optimized to produce a signal corresponding to the carrier-envelope phase within microseconds of the laser interaction, thereby facilitating data-tagging and feedback applications. We achieve a precision of 113 mrad (6.5°) over the entire 2π range.

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