Cite
Corrales C, Ramírez-Malo JB, Fernández-Peña J, et al. Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only. Appl Opt. 1995;34(34):7907-13doi: 10.1364/AO.34.007907.
Corrales, C., Ramírez-Malo, J. B., Fernández-Peña, J., Villares, P., Swanepoel, R., & Márquez, E. (1995). Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only. Applied optics, 34(34), 7907-13. https://doi.org/10.1364/AO.34.007907
Corrales, C, et al. "Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only." Applied optics vol. 34,34 (1995): 7907-13. doi: https://doi.org/10.1364/AO.34.007907
Corrales C, Ramírez-Malo JB, Fernández-Peña J, Villares P, Swanepoel R, Márquez E. Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only. Appl Opt. 1995 Dec 01;34(34):7907-13. doi: 10.1364/AO.34.007907. PMID: 21068885.
Copy
Download .nbib