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Richert R, Agapov A, Sokolov AP. Appearance of a Debye process at the conductivity relaxation frequency of a viscous liquid. J Chem Phys. 2011;134(10):104508doi: 10.1063/1.3565481.
Richert, R., Agapov, A., & Sokolov, A. P. (2011). Appearance of a Debye process at the conductivity relaxation frequency of a viscous liquid. The Journal of chemical physics, 134(10), 104508. https://doi.org/10.1063/1.3565481
Richert, Ranko, et al. "Appearance of a Debye process at the conductivity relaxation frequency of a viscous liquid." The Journal of chemical physics vol. 134,10 (2011): 104508. doi: https://doi.org/10.1063/1.3565481
Richert R, Agapov A, Sokolov AP. Appearance of a Debye process at the conductivity relaxation frequency of a viscous liquid. J Chem Phys. 2011 Mar 14;134(10):104508. doi: 10.1063/1.3565481. PMID: 21405176.
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J Chem Phys. 2011 Mar 14;134(10):104508. doi: 10.1063/1.3565481.

Appearance of a Debye process at the conductivity relaxation frequency of a viscous liquid.

The Journal of chemical physics

Ranko Richert, Alexander Agapov, Alexei P Sokolov

Affiliations

  1. Department of Chemistry and Biochemistry, Arizona State University, Tempe, Arizona 85287-1604, USA. [email protected]

PMID: 21405176 DOI: 10.1063/1.3565481

Abstract

The existence of a Debye-type ultraslow process in dielectric spectra of bulk polyalcohols and similar materials has been reported repeatedly in the recent literature. Its loss peak is observed at frequencies that are decades below those of the primary structural relaxation, in a range where the loss signal is usually dominated by dc-conductivity or even electrode polarization. We show that this peak originates from an incomplete filling of the capacitor volume, e.g., as a result of gas bubbles, a situation that gives rise to a Debye process at the conductivity relaxation frequency of the material, where the values of storage and loss components of permittivity are identical. The result implies that these peaks are not endemic to the liquid and can lead to various misinterpretations of the dielectric relaxation spectra. Techniques avoiding the occurrence of such artifacts are discussed.

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