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Winkelmann A, Vos M. Site-specific recoil diffraction of backscattered electrons in crystals. Phys Rev Lett. 2011;106(8):085503doi: 10.1103/PhysRevLett.106.085503.
Winkelmann, A., & Vos, M. (2011). Site-specific recoil diffraction of backscattered electrons in crystals. Physical review letters, 106(8), 085503. https://doi.org/10.1103/PhysRevLett.106.085503
Winkelmann, Aimo, and Vos, Maarten. "Site-specific recoil diffraction of backscattered electrons in crystals." Physical review letters vol. 106,8 (2011): 085503. doi: https://doi.org/10.1103/PhysRevLett.106.085503
Winkelmann A, Vos M. Site-specific recoil diffraction of backscattered electrons in crystals. Phys Rev Lett. 2011 Feb 25;106(8):085503. doi: 10.1103/PhysRevLett.106.085503. Epub 2011 Feb 24. PMID: 21405583.
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Phys Rev Lett. 2011 Feb 25;106(8):085503. doi: 10.1103/PhysRevLett.106.085503. Epub 2011 Feb 24.

Site-specific recoil diffraction of backscattered electrons in crystals.

Physical review letters

Aimo Winkelmann, Maarten Vos

Affiliations

  1. Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120 Halle(Saale), Germany.

PMID: 21405583 DOI: 10.1103/PhysRevLett.106.085503

Abstract

A novel diffraction effect in high-energy electron backscattering is demonstrated: the formation of element-specific diffraction patterns via nuclear recoil. For sapphire (Al(2)O(3)), the difference in recoil energy allows us to determine if an electron scattered from aluminum or from oxygen. The angular electron distribution obtained in such measurements is a strong function of the recoiling lattice site. These element-specific recoil diffraction features are explained using the dynamical theory of electron diffraction. Our observations open up new possibilities for local, element-resolved crystallographic analysis using quasielastically backscattered electrons in scanning electron microscopy.

© 2011 American Physical Society

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