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Appl Opt. 2011 Mar 20;50(9):C449-56. doi: 10.1364/AO.50.00C449.

Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental results.

Applied optics

Christian Mühlig, Siegfried Kufert, Simon Bublitz, Uwe Speck

Affiliations

  1. Institute of Photonic Technology, Jena, Germany. christian.muehlig@ipht?jena.de

PMID: 21460979 DOI: 10.1364/AO.50.00C449

Abstract

Using experimental results and numerical simulations, two measuring concepts of the laser induced deflection (LID) technique are introduced and optimized for absolute thin film absorption measurements from deep ultraviolet to IR wavelengths. For transparent optical coatings, a particular probe beam deflection direction allows the absorption measurement with virtually no influence of the substrate absorption, yielding improved accuracy compared to the common techniques of separating bulk and coating absorption. For high-reflection coatings, where substrate absorption contributions are negligible, a different probe beam deflection is chosen to achieve a better signal-to-noise ratio. Various experimental results for the two different measurement concepts are presented.

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