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Smeenk C, Salvail JZ, Arissian L, et al. Precise in-situ measurement of laser pulse intensity using strong field ionization. Opt Express. 2011;19(10):9336-44doi: 10.1364/OE.19.009336.
Smeenk, C., Salvail, J. Z., Arissian, L., Corkum, P. B., Hebeisen, C. T., & Staudte, A. (2011). Precise in-situ measurement of laser pulse intensity using strong field ionization. Optics express, 19(10), 9336-44. https://doi.org/10.1364/OE.19.009336
Smeenk, C, et al. "Precise in-situ measurement of laser pulse intensity using strong field ionization." Optics express vol. 19,10 (2011): 9336-44. doi: https://doi.org/10.1364/OE.19.009336
Smeenk C, Salvail JZ, Arissian L, Corkum PB, Hebeisen CT, Staudte A. Precise in-situ measurement of laser pulse intensity using strong field ionization. Opt Express. 2011 May 09;19(10):9336-44. doi: 10.1364/OE.19.009336. PMID: 21643189.
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Opt Express. 2011 May 09;19(10):9336-44. doi: 10.1364/OE.19.009336.

Precise in-situ measurement of laser pulse intensity using strong field ionization.

Optics express

C Smeenk, J Z Salvail, L Arissian, P B Corkum, C T Hebeisen, A Staudte

Affiliations

  1. Joint Laboratory for Attosecond Science, University of Ottawa and National Research Council, 100 Sussex Drive, Ottawa, Canada. [email protected]

PMID: 21643189 DOI: 10.1364/OE.19.009336

Abstract

Building on the work of Alnaser et al. [Phys. Rev. A 70, 023413 (2004)], we devise an improved method for an in-situ measurement of the peak intensity in a focused, femtosecond infrared laser pulse. The method is shown to be effective with both photoion and photoelectron imaging devices. The model used to fit the experimental data has no unphysical free parameters used in fitting. The accuracy of the fit is 4% and the overall accuracy of the measurement is 8%.

© 2011 Optical Society of America

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