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Pearson AJ, Boden SA, Bagnall DM, et al. Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy. Nano Lett. 2011;11(10):4275-81doi: 10.1021/nl202269n.
Pearson, A. J., Boden, S. A., Bagnall, D. M., Lidzey, D. G., & Rodenburg, C. (2011). Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy. Nano letters, 11(10), 4275-81. https://doi.org/10.1021/nl202269n
Pearson, Andrew J, et al. "Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy." Nano letters vol. 11,10 (2011): 4275-81. doi: https://doi.org/10.1021/nl202269n
Pearson AJ, Boden SA, Bagnall DM, Lidzey DG, Rodenburg C. Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy. Nano Lett. 2011 Oct 12;11(10):4275-81. doi: 10.1021/nl202269n. Epub 2011 Sep 16. PMID: 21923098.
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Nano Lett. 2011 Oct 12;11(10):4275-81. doi: 10.1021/nl202269n. Epub 2011 Sep 16.

Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy.

Nano letters

Andrew J Pearson, Stuart A Boden, Darren M Bagnall, David G Lidzey, Cornelia Rodenburg

Affiliations

  1. Department of Physics and Astronomy, University of Sheffield , Hicks Building, Hounsfield Road, Sheffield, S3 7RH, UK. [email protected]

PMID: 21923098 DOI: 10.1021/nl202269n

Abstract

We use helium ion microscopy (HeIM) to image the nanostructure of poly(3-hexylthiophene)/[6,6]-phenyl-C(61)-butric acid methyl ester (P3HT/PCBM) blend thin-films. Specifically, we study a blend thin-film subject to a thermal anneal at 140 °C and use a plasma-etching technique to gain access to the bulk of the blend thin-films. We observe a domain structure within the bulk of the film that is not apparent at the film-surface and tentatively identify a network of slightly elongated PCBM domains having a spatial periodicity of (20 ± 4) nm a length of (12 ± 8) nm.

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