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Chia HJ, Guo F, Belova LM, et al. Nanoscale spin wave localization using ferromagnetic resonance force microscopy. Phys Rev Lett. 2012;108(8):087206doi: 10.1103/PhysRevLett.108.087206.
Chia, H. J., Guo, F., Belova, L. M., & McMichael, R. D. (2012). Nanoscale spin wave localization using ferromagnetic resonance force microscopy. Physical review letters, 108(8), 087206. https://doi.org/10.1103/PhysRevLett.108.087206
Chia, Han-Jong, et al. "Nanoscale spin wave localization using ferromagnetic resonance force microscopy." Physical review letters vol. 108,8 (2012): 087206. doi: https://doi.org/10.1103/PhysRevLett.108.087206
Chia HJ, Guo F, Belova LM, McMichael RD. Nanoscale spin wave localization using ferromagnetic resonance force microscopy. Phys Rev Lett. 2012 Feb 24;108(8):087206. doi: 10.1103/PhysRevLett.108.087206. Epub 2012 Feb 24. PMID: 22463567.
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Phys Rev Lett. 2012 Feb 24;108(8):087206. doi: 10.1103/PhysRevLett.108.087206. Epub 2012 Feb 24.

Nanoscale spin wave localization using ferromagnetic resonance force microscopy.

Physical review letters

Han-Jong Chia, Feng Guo, L M Belova, R D McMichael

Affiliations

  1. Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA. [email protected]

PMID: 22463567 DOI: 10.1103/PhysRevLett.108.087206

Abstract

We use the dipolar fields from a magnetic cantilever tip to generate localized spin wave precession modes in an in-plane magnetized, thin ferromagnetic film. Multiple resonances from a series of localized modes are detected by ferromagnetic resonance force microscopy and reproduced by micromagnetic models that also reveal highly anisotropic mode profiles. Modeled scans of line defects using the lowest-frequency mode provide resolution predictions of (94.5±1.5) nm in the field direction, and (390±2) nm perpendicular to the field.

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