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Opt Lett. 2012 Aug 01;37(15):3033-5. doi: 10.1364/OL.37.003033.

Investigating the interaction of x-ray free electron laser radiation with grating structure.

Optics letters

Jérôme Gaudin, Cigdem Ozkan, Jaromír Chalupský, Saša Bajt, Tomáš Burian, Ludek Vyšín, Nicola Coppola, Shafagh Dastjani Farahani, Henry N Chapman, Germano Galasso, Vera Hájková, Marion Harmand, Libor Juha, Marek Jurek, Rolf A Loch, Stefan Möller, Mitsuru Nagasono, Michael Störmer, Harald Sinn, Karel Saksl, Ryszard Sobierajski, Joachim Schulz, Pavol Sovak, Sven Toleikis, Kai Tiedtke, Thomas Tschentscher, Jacek Krzywinski

Affiliations

  1. European XFEL GmbH, Hamburg, Germany. [email protected]

PMID: 22859076 DOI: 10.1364/OL.37.003033

Abstract

The interaction of free electron laser pulses with grating structure is investigated using 4.6±0.1 nm radiation at the FLASH facility in Hamburg. For fluences above 63.7±8.7 mJ/cm2, the interaction triggers a damage process starting at the edge of the grating structure as evidenced by optical and atomic force microscopy. Simulations based on solution of the Helmholtz equation demonstrate an enhancement of the electric field intensity distribution at the edge of the grating structure. A procedure is finally deduced to evaluate damage threshold.

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