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Quitoriano NJ, Sanderson RN, Bae SS, et al. Interpreting Kelvin probe force microscopy under an applied electric field: local electronic behavior of vapor-liquid-solid Si nanowires. Nanotechnology. 2013;24(20):205704doi: 10.1088/0957-4484/24/20/205704.
Quitoriano, N. J., Sanderson, R. N., Bae, S. S., & Ragan, R. (2013). Interpreting Kelvin probe force microscopy under an applied electric field: local electronic behavior of vapor-liquid-solid Si nanowires. Nanotechnology, 24(20), 205704. https://doi.org/10.1088/0957-4484/24/20/205704
Quitoriano, Nathaniel J, et al. "Interpreting Kelvin probe force microscopy under an applied electric field: local electronic behavior of vapor-liquid-solid Si nanowires." Nanotechnology vol. 24,20 (2013): 205704. doi: https://doi.org/10.1088/0957-4484/24/20/205704
Quitoriano NJ, Sanderson RN, Bae SS, Ragan R. Interpreting Kelvin probe force microscopy under an applied electric field: local electronic behavior of vapor-liquid-solid Si nanowires. Nanotechnology. 2013 May 24;24(20):205704. doi: 10.1088/0957-4484/24/20/205704. Epub 2013 Apr 23. PMID: 23609527.
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