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Gomella A, Martin EW, Lynch SK, et al. Low dose hard x-ray contact microscopy assisted by a photoelectric conversion layer. AIP Adv. 2013;3(4):42121doi: 10.1063/1.4802886.
Gomella, A., Martin, E. W., Lynch, S. K., Morgan, N. Y., & Wen, H. (2013). Low dose hard x-ray contact microscopy assisted by a photoelectric conversion layer. AIP advances, 3(4), 42121. https://doi.org/10.1063/1.4802886
Gomella, Andrew, et al. "Low dose hard x-ray contact microscopy assisted by a photoelectric conversion layer." AIP advances vol. 3,4 (2013): 42121. doi: https://doi.org/10.1063/1.4802886
Gomella A, Martin EW, Lynch SK, Morgan NY, Wen H. Low dose hard x-ray contact microscopy assisted by a photoelectric conversion layer. AIP Adv. 2013 Apr 18;3(4):42121. doi: 10.1063/1.4802886. Print 2013 Apr. PMID: 23837131; PMCID: PMC3645440.
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AIP Adv. 2013 Apr 18;3(4):42121. doi: 10.1063/1.4802886. Print 2013 Apr.

Low dose hard x-ray contact microscopy assisted by a photoelectric conversion layer.

AIP advances

Andrew Gomella, Eric W Martin, Susanna K Lynch, Nicole Y Morgan, Han Wen

Affiliations

  1. Imaging Physics Laboratory, Biophysics and Biochemistry Center, National Heart, Lung and Blood Institute, National Institutes of Health, Bethesda, MD, 20892, USA.

PMID: 23837131 PMCID: PMC3645440 DOI: 10.1063/1.4802886

Abstract

Hard x-ray contact microscopy provides images of dense samples at resolutions of tens of nanometers. However, the required beam intensity can only be delivered by synchrotron sources. We report on the use of a gold photoelectric conversion layer to lower the exposure dose by a factor of 40 to 50, allowing hard x-ray contact microscopy to be performed with a compact x-ray tube. We demonstrate the method in imaging the transmission pattern of a type of hard x-ray grating that cannot be fitted into conventional x-ray microscopes due to its size and shape. Generally the method is easy to implement and can record images of samples in the hard x-ray region over a large area in a single exposure, without some of the geometric constraints associated with x-ray microscopes based on zone-plate or other magnifying optics.

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