Cite
Hansen KV, Wu Y, Jacobsen T, et al. Improved controlled atmosphere high temperature scanning probe microscope. Rev Sci Instrum. 2013;84(7):073701doi: 10.1063/1.4811848.
Hansen, K. V., Wu, Y., Jacobsen, T., Mogensen, M. B., & Theil Kuhn, L. (2013). Improved controlled atmosphere high temperature scanning probe microscope. The Review of scientific instruments, 84(7), 073701. https://doi.org/10.1063/1.4811848
Hansen, K V, et al. "Improved controlled atmosphere high temperature scanning probe microscope." The Review of scientific instruments vol. 84,7 (2013): 073701. doi: https://doi.org/10.1063/1.4811848
Hansen KV, Wu Y, Jacobsen T, Mogensen MB, Theil Kuhn L. Improved controlled atmosphere high temperature scanning probe microscope. Rev Sci Instrum. 2013 Jul;84(7):073701. doi: 10.1063/1.4811848. PMID: 23902070.
Copy
Download .nbib