Cite
Mingard KP, Jones HG, Gee MG. Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methods. J Microsc. 2013;253(2):93-108doi: 10.1111/jmi.12100.
Mingard, K. P., Jones, H. G., & Gee, M. G. (2014). Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methods. Journal of microscopy, 253(2), 93-108. https://doi.org/10.1111/jmi.12100
Mingard, K P, et al. "Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methods." Journal of microscopy vol. 253,2 (2014): 93-108. doi: https://doi.org/10.1111/jmi.12100
Mingard KP, Jones HG, Gee MG. Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methods. J Microsc. 2014 Feb;253(2):93-108. doi: 10.1111/jmi.12100. Epub 2013 Dec 05. PMID: 24308722.
Copy
Download .nbib