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Kohlgraf-Owens DC, Greusard L, Sukhov S, et al. Multi-frequency near-field scanning optical microscopy. Nanotechnology. 2013;25(3):035203doi: 10.1088/0957-4484/25/3/035203.
Kohlgraf-Owens, D. C., Greusard, L., Sukhov, S., Wilde, Y. D., & Dogariu, A. (2014). Multi-frequency near-field scanning optical microscopy. Nanotechnology, 25(3), 035203. https://doi.org/10.1088/0957-4484/25/3/035203
Kohlgraf-Owens, Dana C, et al. "Multi-frequency near-field scanning optical microscopy." Nanotechnology vol. 25,3 (2014): 035203. doi: https://doi.org/10.1088/0957-4484/25/3/035203
Kohlgraf-Owens DC, Greusard L, Sukhov S, Wilde YD, Dogariu A. Multi-frequency near-field scanning optical microscopy. Nanotechnology. 2014 Jan 24;25(3):035203. doi: 10.1088/0957-4484/25/3/035203. Epub 2013 Dec 17. PMID: 24346240.
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Nanotechnology. 2014 Jan 24;25(3):035203. doi: 10.1088/0957-4484/25/3/035203. Epub 2013 Dec 17.

Multi-frequency near-field scanning optical microscopy.

Nanotechnology

Dana C Kohlgraf-Owens, Léo Greusard, Sergey Sukhov, Yannick De Wilde, Aristide Dogariu

Affiliations

  1. CREOL, The College of Optics and Photonics, University of Central Florida, Orlando, FL 32816, USA.

PMID: 24346240 DOI: 10.1088/0957-4484/25/3/035203

Abstract

We demonstrate a new multi-frequency approach for mapping near-field optically induced forces with subwavelength spatial resolution. The concept relies on oscillating a scanning probe at two different frequencies. Oscillations at one frequency are driven electrically to provide positional feedback regulation. Modulations at another frequency are induced optically and are used to measure the mechanical action of the optical field on the probe. Because the measurement is based on locally detecting the force of the electromagnetic radiation acting on the probe, the new method does not require a photodetector to map the radiation distribution and, therefore, can provide true broadband detection of light with a single probe.

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