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Ruiz-Zepeda F, Casallas-Moreno YL, Cantu-Valle J, et al. Precession electron diffraction-assisted crystal phase mapping of metastable c-GaN films grown on (001) GaAs. Microsc Res Tech. 2014;77(12):980-5doi: 10.1002/jemt.22424.
Ruiz-Zepeda, F., Casallas-Moreno, Y. L., Cantu-Valle, J., Alducin, D., Santiago, U., José-Yacaman, M., López-López, M., & Ponce, A. (2014). Precession electron diffraction-assisted crystal phase mapping of metastable c-GaN films grown on (001) GaAs. Microscopy research and technique, 77(12), 980-5. https://doi.org/10.1002/jemt.22424
Ruiz-Zepeda, Francisco, et al. "Precession electron diffraction-assisted crystal phase mapping of metastable c-GaN films grown on (001) GaAs." Microscopy research and technique vol. 77,12 (2014): 980-5. doi: https://doi.org/10.1002/jemt.22424
Ruiz-Zepeda F, Casallas-Moreno YL, Cantu-Valle J, Alducin D, Santiago U, José-Yacaman M, López-López M, Ponce A. Precession electron diffraction-assisted crystal phase mapping of metastable c-GaN films grown on (001) GaAs. Microsc Res Tech. 2014 Dec;77(12):980-5. doi: 10.1002/jemt.22424. Epub 2014 Aug 14. PMID: 25123258.
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