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Gautam A, Ophus C, Lançon F, et al. Analysis of grain boundary dynamics using event detection and cumulative averaging. Ultramicroscopy. 2014;151:78-84doi: 10.1016/j.ultramic.2014.11.008.
Gautam, A., Ophus, C., Lançon, F., Denes, P., & Dahmen, U. (2015). Analysis of grain boundary dynamics using event detection and cumulative averaging. Ultramicroscopy, 15178-84. https://doi.org/10.1016/j.ultramic.2014.11.008
Gautam, A, et al. "Analysis of grain boundary dynamics using event detection and cumulative averaging." Ultramicroscopy vol. 151 (2015): 78-84. doi: https://doi.org/10.1016/j.ultramic.2014.11.008
Gautam A, Ophus C, Lançon F, Denes P, Dahmen U. Analysis of grain boundary dynamics using event detection and cumulative averaging. Ultramicroscopy. 2015 Apr;151:78-84. doi: 10.1016/j.ultramic.2014.11.008. Epub 2014 Nov 26. PMID: 25498139.
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Ultramicroscopy. 2015 Apr;151:78-84. doi: 10.1016/j.ultramic.2014.11.008. Epub 2014 Nov 26.

Analysis of grain boundary dynamics using event detection and cumulative averaging.

Ultramicroscopy

A Gautam, C Ophus, F Lançon, P Denes, U Dahmen

Affiliations

  1. National Center for Electron Microscopy, LBNL, Berkeley, CA 94720, USA.
  2. Laboratoire de Simulation Atomistique (L_Sim), SP2M, INAC, CEA, 38054 Grenoble, France.
  3. National Center for Electron Microscopy, LBNL, Berkeley, CA 94720, USA. Electronic address: [email protected].

PMID: 25498139 DOI: 10.1016/j.ultramic.2014.11.008

Abstract

To analyze extended time series of high resolution images, we have employed automated frame-by-frame comparisons that are able to detect dynamic changes in the structure of a grain boundary in Au. Using cumulative averaging of images between events allowed high resolution measurements of the atomic relaxation in the interface with sufficient accuracy for comparison with atomistic models. Cumulative averaging was also used to observe the structural rearrangement of atomic columns at a moving step in the grain boundary. The technique of analyzing changing features in high resolution images by averaging between incidents can be used to deconvolute stochastic events that occur at random intervals and on time scales well beyond that accessible to single-shot imaging.

Copyright © 2014 Elsevier B.V. All rights reserved.

Keywords: Aberration correction; Atomic structure; Dynamics; Electron detector; Grain boundary; HAADF; HRTEM; Simulation; Step; Time average

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