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Dietz C, Schulze M, Voss A, et al. Bimodal frequency-modulated atomic force microscopy with small cantilevers. Nanoscale. 2015;7(5):1849-56doi: 10.1039/c4nr05907g.
Dietz, C., Schulze, M., Voss, A., Riesch, C., & Stark, R. W. (2015). Bimodal frequency-modulated atomic force microscopy with small cantilevers. Nanoscale, 7(5), 1849-56. https://doi.org/10.1039/c4nr05907g
Dietz, Christian, et al. "Bimodal frequency-modulated atomic force microscopy with small cantilevers." Nanoscale vol. 7,5 (2015): 1849-56. doi: https://doi.org/10.1039/c4nr05907g
Dietz C, Schulze M, Voss A, Riesch C, Stark RW. Bimodal frequency-modulated atomic force microscopy with small cantilevers. Nanoscale. 2015 Feb 07;7(5):1849-56. doi: 10.1039/c4nr05907g. PMID: 25522181.
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