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Nano Lett. 2015 Apr 08;15(4):2343-9. doi: 10.1021/acs.nanolett.5b00698. Epub 2015 Mar 23.

Defective interfaces in yttrium-doped barium zirconate films and consequences on proton conduction.

Nano letters

Nan Yang, Claudia Cantoni, Vittorio Foglietti, Antonello Tebano, Alex Belianinov, Evgheni Strelcov, Stephen Jesse, Daniele Di Castro, Elisabetta Di Bartolomeo, Silvia Licoccia, Sergei V Kalinin, Giuseppe Balestrino, Carmela Aruta

Affiliations

  1. †National Research Council CNR-SPIN, University of Roma "Tor Vergata", Rome I-00133, Italy.
  2. ‡NAST Center, University of Roma "Tor Vergata", Rome I-00133, Italy.
  3. §Engineering Faculty, Università degli studi Niccolò Cusano, Rome I-00166, Italy.
  4. ?Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
  5. ?Department DICII, University of Roma Tor Vergata, Rome I-00133, Italy.
  6. ?Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
  7. ¶Department of Chemical Sciences and Technologies, University of Roma "Tor Vergata", Rome 00133, Italy.

PMID: 25789878 DOI: 10.1021/acs.nanolett.5b00698

Abstract

Yttrium-doped barium zirconate (BZY) thin films recently showed surprising electric transport properties. Experimental investigations conducted mainly by electrochemical impedance spectroscopy suggested that a consistent part of this BZY conductivity is of protonic nature. These results have stimulated further investigations by local unconventional techniques. Here, we use electrochemical strain microscopy (ESM) to detect electrochemical activity in BZY films with nanoscale resolution. ESM in a novel cross-sectional measuring setup allows the direct visualization of the interfacial activity. The local electrochemical investigation is compared with the structural studies performed by state of art scanning transmission electron microscopy (STEM). The ESM and STEM results show a clear correlation between the conductivity and the interface structural defects. We propose a physical model based on a misfit dislocation network that introduces a novel 2D transport phenomenon, whose fingerprint is the low activation energy measured.

Keywords: SPM; STEM; doped barium zirconate; electrolytes; interface defects; ionic conduction; perovskite oxide thin films

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